Equipment

Scanning Electron Microscopy (SEM)

Zeiss Sigma VP (NL1.160F)

Zeiss Sigma
Zeiss SigmaVP 

Specifications:

  • Field Emission SEM
  • ET Detector
  • In-Lens Detector
  • Back Scatter Detector
  • High-vacuum operation for highest resolution
  • Low-vacuum operation allows imaging of uncoated samples
  • Sign Up for Sigma VP