New TIRF technique with improved background rejection published in Optics Express

Using a combination of structured illumination and TIRF microscopy, Reto Fiolka demonstrated improved optical sectioning in TIRF microscopy. In addition, the same setup and optical trick can also be used from HILO microscopy, an operating mode that helps imaging deeper into cells when using a TIRF setup. This work is now published in Optics Express, Vol. 24, Issue 26.